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High And Low Temperature Internal Short Circuit Test Machine

The high and low temperature internal short circuit tester is mainly used to simulate the situation where metal dust, debris particles and other impurities that may enter various types of single cells during the manufacturing process pierce the diaphragm between the positive and negative electrodes to cause internal short circuits. At the same time, test data is obtained to provide experimental data and basis for optimizing product design, as well as safety risk assessment and verification.

Device Model

RJD-HLT-DC-5KN-200

Dimensions W*D*H(mm)

W1200mm*D1500mm*H1950mm

Structural method

Vertical

Power supply

380V/three-phase five-wire

Power

5KW

Pressure range

0~5KN

Pressure accuracy

±0.5%F.S

Speed range

0.01mm/s~5mm/s

Speed accuracy

±0.01mm/s

Temperature range

0℃~80℃ (adjustable)

Pressure control method

All-electric servo

Equipment structure

Four columns and three boards

Displacement stroke

0-200mm (customizable)

Displacement accuracy

±0.02mm

Pressure sampling rate

100Hz

Control method

Touch screen/remote PC control

Video surveillance

Optional

Spraying device

Optional

Data collection

Configuration options

Standard Configuration

Upgrade Configuration

High-speed acquisition configuration

Voltage acquisition

Single cell voltage

0-5V/0-10V

0-10V

±10V

Number of channels

Standard 4 channels

Standard 4 channels

Standard 8 channels

Acquisition rate

100Hz

10KHz

10KHz

Collection accuracy

±0.15%F.S

±0.15%F.S

±0.05%F.S

Number of channels

Standard 4 channels

Standard 4 channels

Standard 8 channels

Acquisition rate

100Hz

10KHz

10KHz

Temperature collection

Acquisition range

0-1200℃

0-1200℃

0-1200℃

Number of channels

Standard 4 channels

Standard 4 channels

Standard 8 channels

Acquisition rate

10Hz

75Hz

100Hz

Collection accuracy

±2℃

±1.5℃

±1℃


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